Plainsboro, NJ, United States of America

Ketan Thakker

This inventor holds 1 USPTO granted patent. Top assignee: Educational Testing Service. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ketan Thakker. Retrieved from https://idiyas.com/inventor/ketan-thakker

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Ketan Thakker: Innovator in Test Item Rendering Systems

Introduction

Ketan Thakker is a notable inventor based in Plainsboro, NJ (US). He has made significant contributions to the field of test item rendering systems. His innovative work focuses on identifying anomalies in graphical representations of test items.

Latest Patents

Ketan Thakker holds a patent for "Systems and methods for identifying anomalous test item renderings." This patent describes systems and methods for determining a test item rendering anomaly. The process involves providing a test item to two different rendering systems, capturing digital pixel images of their graphical representations, and processing these images to identify discrepancies. An indication is provided when the differences exceed a certain threshold, ensuring accuracy in test item evaluations. He has 1 patent to his name.

Career Highlights

Ketan Thakker is currently employed at Educational Testing Service, where he applies his expertise in developing innovative solutions for educational assessments. His work has been instrumental in enhancing the reliability of test item renderings.

Collaborations

Ketan collaborates with talented individuals such as Mankit Lee and Roman Merkushen. Their combined efforts contribute to the advancement of technology in educational testing.

Conclusion

Ketan Thakker's contributions to the field of test item rendering systems demonstrate his commitment to innovation and excellence. His work continues to impact the educational sector positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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