The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Oct. 30, 2015
Educational Testing Service, Princeton, NJ (US);
Mankit Lee, Plainsboro, NJ (US);
Roman Merkushen, Lanoka Harbor, NJ (US);
Ketan Thakker, Plainsboro, NJ (US);
Educational Testing Service, Princeton, NJ (US);
Abstract
Systems and methods are provided for determining a test item rendering anomaly. A test item is provided to a first test item rendering system that is configured to generate a first graphical representation of the test item. The test item is provided to a second test item rendering system that is configured to generate a second graphical representation of the test item. A first digital pixel image of the first graphical representation is captured, and a second digital pixel image of the second graphical representation is captured. Pixels of the digital pixel images are processed, where the processing includes comparing the digital pixel images to determine an extent to which the second digital pixel image differs from the first digital pixel image. An indication for the test item is provided when the second digital pixel image differs from the first digital pixel image by more than a threshold amount.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile