Vaughan, Canada

Keqing Wang

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keqing Wang. Retrieved from https://idiyas.com/inventor/keqing-wang-tm37r4iv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Keqing Wang and Data Quality Innovation

Introduction

Keqing Wang is an inventor associated with Vaughan, Canada, and International Business Machines Corporation. Her patent work addresses data quality and master data management, helping determine when records match and how they should be handled.

Latest Patents

Wang is associated with 1 patent: “Data Quality Metric-Based Record Manipulation for Master Data Management.” The invention compares pairs of data records by scoring how closely corresponding attributes match. It also calculates data quality metric scores for the attributes and combines them into a dimension match score. These scores form a feature vector that is evaluated against a threshold to determine whether the records match. The resulting match information guides record manipulation, and the processed data can then be used for further processing, reporting, or analytics.

Career Highlights

Wang’s listed patent reflects work on improving the reliability and consistency of data used in master data management. Her affiliation with International Business Machines Corporation connects this work to the company’s broader technology and data-management activities.

Collaborations

The provided information lists Mohammad Khatibi and Ruolin Wu as Wang’s coworkers. Their names are associated with her professional context, though specific collaborative roles in the patent are not detailed here.

Conclusion

Keqing Wang’s patent focuses on using data quality metrics and attribute comparisons to guide record matching and manipulation, supporting more dependable data management and analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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