The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Feb. 12, 2025
International Business Machines Corporation, Armonk, NY (US);
Mohammad Khatibi, Richmond Hill, CA;
Ruolin Wu, Mississauga, CA;
Linghao Yu, Richmond Hill, CA;
Keqing Wang, Vaughan, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Data quality metric-based record manipulation for master data management includes generating for a pair of data records, attribute pair scores quantifying an extent of match between an attribute of a data record of the pair with a corresponding attribute of another data record in the pair. Data quality metric scores for data quality metrics are computed for each attribute of the pair of data records. A dimension match score is generated that aggregates these scores across multiple data quality metrics. The dimension match score and attribute pair score are combined to create a pair feature vector, which is evaluated against a threshold to determine match outcome information for the pair of data records. Manipulation of the data records is executed in accordance with the match outcome information. The manipulated data is output for further processing, reporting, or analytics.