Miyazaki, Japan

Kentaro Yano

This inventor holds 1 USPTO granted patent. Top assignee: Mitutoyo Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kentaro Yano. Retrieved from https://idiyas.com/inventor/kentaro-yano-yyq3vaq9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Kentaro Yano: Innovator in Precision Measurement

Introduction

Kentaro Yano is a notable inventor based in Miyazaki, Japan. He has made significant contributions to the field of precision measurement, particularly with his innovative step gauge design. His work exemplifies the intersection of engineering and practical application in measurement technology.

Latest Patents

Kentaro Yano holds a patent for a step gauge, which includes measurement blocks with reference measurement surfaces and interval blocks that maintain a predetermined distance between the measurement blocks. The design features a tie rod made from a material with a low coefficient of linear thermal expansion, ensuring accuracy in measurements. This invention is particularly valuable in applications requiring precise distance measurements.

Career Highlights

Yano is associated with Mitutoyo Corporation, a leading company in the field of measurement instruments. His role at Mitutoyo has allowed him to develop and refine his innovative ideas, contributing to the company's reputation for high-quality measurement solutions.

Collaborations

Kentaro Yano has worked alongside talented colleagues such as Akihiko Matsuura and Tatsuya Narumi. Their collaborative efforts have fostered an environment of innovation and creativity within the company.

Conclusion

Kentaro Yano's contributions to measurement technology through his step gauge patent highlight his role as an influential inventor. His work continues to impact the field of precision measurement, showcasing the importance of innovation in engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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