Tokyo, Japan

Kentaro Sasahara

This inventor holds 2 USPTO granted patents. Top assignee: Renesas Electronics Corporation. Active years: 2020-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kentaro Sasahara. Retrieved from https://idiyas.com/inventor/kentaro-sasahara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2020-2023

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2 patents (USPTO):Explore Patents

Title: Kentaro Sasahara: Innovator in Abnormality Detection Technology

Introduction

Kentaro Sasahara is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of abnormality detection technology, holding a total of 2 patents. His work focuses on developing advanced systems that enhance the detection of abnormalities in various applications.

Latest Patents

Kentaro's latest patents include innovative designs for abnormality detection apparatuses and vehicle systems. The first patent describes an abnormality detection apparatus that features a feature extraction circuit. This circuit is designed to extract feature points and values from two images, enabling the detection of abnormalities based on optical flow calculations. The second patent also outlines an abnormality detection apparatus that utilizes a common algorithm for image feature extraction. It includes multiple detection units that work together to identify abnormalities in both images based on defined extraction areas.

Career Highlights

Kentaro Sasahara is currently employed at Renesas Electronics Corporation, where he continues to push the boundaries of technology. His expertise in abnormality detection systems has positioned him as a key player in the industry. His innovative approaches have garnered attention and respect among his peers.

Collaborations

Kentaro collaborates with talented individuals such as Yuki Kajiwara and Kosuke Miyagawa. Together, they work on advancing technologies that improve the efficiency and accuracy of abnormality detection systems.

Conclusion

Kentaro Sasahara's contributions to the field of abnormality detection technology are noteworthy. His patents reflect a commitment to innovation and excellence in engineering. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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