The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
May. 26, 2020
Renesas Electronics Corporation, Tokyo, JP;
Yuki Kajiwara, Tokyo, JP;
Kosuke Miyagawa, Tokyo, JP;
Masaki Nishibu, Tokyo, JP;
Kentaro Sasahara, Tokyo, JP;
RENESAS ELECTRONICS CORPORATION, Tokyo, JP;
Abstract
An abnormality detection apparatus including a feature extraction circuit configured to extract a feature point and a feature value of a first image, and a feature point and a feature value of a second image, a flow calculation circuit configured to calculate, based on the feature value of the first image, a first abnormality detection circuit configured to detect an abnormality in the first image based on a first optical flow, and to detect an abnormality in the second image based on a third optical flow, and a second abnormality detection circuit configured to detect an abnormality in the first or second image based on a result of a comparison between the second optical flow and a fourth optical flow.