Hachioji, Japan

Kensuke Sekihara

This inventor holds 1 USPTO granted patent. Top assignee: Tdk Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kensuke Sekihara. Retrieved from https://idiyas.com/inventor/kensuke-sekihara-zlp6c3ci

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kensuke Sekihara: Inventor of a Noise-Canceling Measurement Device.

Introduction

Kensuke Sekihara is an inventor associated with Hachioji, Japan. His patent work includes a measurement device designed to separate a target signal from noise through staged signal processing.

Latest Patents

Sekihara is credited with 1 patent, titled “Measurement Device.” The invention includes a signal sensor unit that measures a signal containing both a target signal and noise, along with a reference sensor unit that uses two or more sensors to measure the noise.

A processing unit divides the reference sensor data into two groups. It first uses data from one group to reduce noise in the signal sensor data, then applies data from the second group to further reduce noise in the processed signal.

Career Highlights

Sekihara is associated with TDK Corporation. His patented measurement device highlights a two-stage approach to noise cancellation, using separate groups of reference sensor data in successive processing steps.

Collaborations

Yu Hotta is identified as Sekihara’s coworker. The available information does not specify their particular projects or contributions to the measurement-device patent.

Conclusion

Kensuke Sekihara’s patent describes a measurement device that uses staged noise cancellation to help isolate target signals, reflecting his documented inventive work and association with TDK Corporation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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