The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Nov. 21, 2024
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Yu Hotta, Tokyo, JP;

Kensuke Sekihara, Hachioji, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01); G01R 33/02 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0029 (2013.01); G01R 33/02 (2013.01);
Abstract

A measurement device includes a signal sensor unit having one or more signal sensors configured to measure a measurement signal in which a target signal and noise are mixed, a reference sensor unit having two or more reference sensors configured to measure a reference signal including the noise, and a processing unit. The processing unit includes a reference sensor data group unit configured to classify reference sensor data that is data of two or more reference signals measured by the two or more reference sensors of the reference sensor unit into two groups, a first-order signal processing unit configured to perform a noise cancelation process for signal sensor data using reference sensor data of a first group, and a second-order signal processing unit configured to perform a noise cancelation process for first-order signal-processed data using reference sensor data of a second group.


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Hotta, Yu. (2026). Measurement device (U.S. Patent No. 12768910). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768910

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