San Juan Bautista, CA, United States of America

Kenneth A Snow

This inventor holds 1 USPTO granted patent. Top assignee: Peak Systems, Inc.. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenneth A Snow. Retrieved from https://idiyas.com/inventor/kenneth-a-snow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: The Innovations of Kenneth A. Snow

Introduction

Kenneth A. Snow is an accomplished inventor based in San Juan Bautista, California. He has made significant contributions to the field of temperature measurement technology. His innovative approach has led to the development of a unique method that enhances the accuracy of temperature readings in various applications.

Latest Patents

Kenneth A. Snow holds a patent for a "Method and apparatus for temperature measurement using thermal expansion." This invention provides an apparatus and method for determining the temperature of an object, such as a semiconductor wafer, by measuring the physical change in a dimension of the semiconductor wafer. The physical change is then correlated to the temperature using the coefficient of thermal expansion for the wafer. This patent showcases his expertise in combining physics and engineering to solve practical problems.

Career Highlights

Kenneth A. Snow is currently associated with Peak Systems, Inc., where he continues to innovate and develop new technologies. His work at the company reflects his commitment to advancing measurement techniques and improving the efficiency of temperature monitoring systems.

Collaborations

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Conclusion

Kenneth A. Snow's contributions to temperature measurement technology exemplify the spirit of innovation. His patent and work at Peak Systems, Inc. highlight his dedication to enhancing the accuracy and efficiency of measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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