Susono, Japan

Kenji Tsubosaka

This inventor holds 15 USPTO granted patents and 3 published patent applications, plus 8 CIPO patents and 3 EPO patents. Top assignees: Toyota Jidosha Kabushiki Kaisha, Nippon Soken, Inc., Toyota Boshoku Kabushiki Kaisha. Active years: 2012-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Tsubosaka. Retrieved from https://idiyas.com/inventor/kenji-tsubosaka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 15 

% Patents Active = 80.0


 

Average Co-Inventor Count = 2.9

ph-index = 2

Forward Citations = 14(Granted Patents)


Location History:

  • Susono, JP (2012 - 2017)
  • Toyota, JP (2016 - 2020)
  • Nagakute, JP (2022)

Company Filing History:


Years Active: 2012-2025

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15 patents (USPTO):Explore Patents

Title: Kenji Tsubosaka - Innovator in Inspection Technology

Introduction

Kenji Tsubosaka is an inventor based in Toyota-shi, Japan. He has made contributions to the field of inspection technology, particularly with his innovative approach to inspecting workpieces with stepped portions. His work focuses on enhancing the efficiency and accuracy of inspection devices.

Latest Patent Applications

Kenji Tsubosaka has filed a patent application for an inspection device designed to inspect a workpiece having a stepped portion. This device comprises a pair of electrode plates that nip the workpiece between them and apply voltage to the workpiece. The first electrode plate is positioned on the stepped portion side, while the second electrode plate is located on the opposite side. Additionally, a heat transferring member is included to ensure there is no gap between the stepped portion and the first electrode plate.

Conclusion

Kenji Tsubosaka's innovative inspection device represents a significant advancement in the field of inspection technology. His work aims to improve the quality and reliability of inspections in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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