This inventor holds 1 USPTO granted patent. Top assignee: Gunma University. Active years: 2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010
Title: Kenji Mogi: Innovator in Region-in-Object Measurement Technology
Introduction
Kenji Mogi is a distinguished inventor based in Maebashi, Japan. He has made significant contributions to the field of measurement technology, particularly in the area of region-in-object measurement systems. His innovative approach has led to the development of a unique patent that enhances the accuracy of X-ray imaging.
Latest Patents
Kenji Mogi holds a patent for a "Measuring system, computing device and computer readable medium having program executing to perform measuring a region-in-object." This system comprises a reference object with two frames: an object surface frame that contacts the surface of an object and a film frame that interacts with an X-ray film. The computing device establishes a three-dimensional X-ray coordinate system based on a two-dimensional X-ray image, allowing for precise determination of the position and direction of specific regions within an object.
Career Highlights
Kenji Mogi is affiliated with Gunma University, where he continues to advance his research and development efforts. His work has garnered attention for its potential applications in medical imaging and diagnostics. With a focus on improving measurement accuracy, Mogi's contributions are paving the way for future innovations in the field.
Collaborations
Kenji Mogi collaborates with notable colleagues, including Naoya Ohta and Yoshiki Nakasone. Their combined expertise enhances the research and development efforts at Gunma University, fostering an environment of innovation and discovery.
Conclusion
Kenji Mogi's work in region-in-object measurement technology exemplifies the impact of innovative thinking in the field of measurement systems. His patent and ongoing research contribute significantly to advancements in X-ray imaging and measurement accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
