The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Dec. 21, 2005
Naoya Ohta, Maebashi, JP;
Kenji Mogi, Maebashi, JP;
Yoshiki Nakasone, Maebashi, JP;
National University Corporation Gunma University, Gunma, JP;
Abstract
A region-in object measuring system comprises a reference object () having two frames, i.e., an object surface frame () brought into contact with the surface of an object and a film frame () with which an X-ray film () is brought into contact, spaced from each other and a computing device. The computing device sets a three-dimensional X-ray coordinate system using the reference object () according to a two-dimensional X-ray image acquired by imaging a region in an object in a state that the object surface frame () of the reference object () is in close contact with the surface of the object by means of an X-ray imaging apparatus, determining the position of an X-ray source from the projection magnification and size of the image of the object surface frame (), determining the position vector of a specific region in a body according to the position of the X-ray source, and accurately determines the direction and three-dimensional position of the region in the object with respect to the position of the image of the region in the object shown on the X-ray image.