Hitachinaka, Japan

Kenji Kohzu

This inventor holds 1 USPTO granted patent. Top assignee: Renesas Electronics Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Kohzu. Retrieved from https://idiyas.com/inventor/kenji-kohzu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Kenji Kohzu: Innovator in Semiconductor Technology

Introduction

Kenji Kohzu is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent.

Latest Patents

Kenji Kohzu holds a patent for a semiconductor device, semiconductor wafer, and the manufacturing method of the same. This invention involves a process where an adhesive tape is attached to the main surface of a semiconductor wafer. A trench is then formed in the rear surface of the semiconductor wafer using photolithography technology. The resist film is patterned to ensure that no film remains in the trench formation area. The trench is subsequently created in a predetermined region of the semiconductor wafer through dry etching technology, specifically near the dicing line.

Career Highlights

Kenji Kohzu is currently employed at Renesas Electronics Corporation, where he continues to advance semiconductor technology. His work has been instrumental in enhancing the efficiency and effectiveness of semiconductor manufacturing processes.

Collaborations

Kenji has collaborated with notable coworkers, including Yasuhiro Naka and Naotaka Tanaka, contributing to various projects within the semiconductor field.

Conclusion

Kenji Kohzu's innovative work in semiconductor technology exemplifies the importance of advancements in this critical industry. His patent reflects a commitment to improving manufacturing methods and enhancing product quality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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