Kyoto, Japan

Kenji Kamada

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Kamada. Retrieved from https://idiyas.com/inventor/kenji-kamada-crsuebzs

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Kenji Kamada: Innovator in Spectrometric Measurement

Introduction

Kenji Kamada is a distinguished inventor based in Kyoto, Japan. He has made significant contributions to the field of spectrometry, particularly in measuring transient absorbance and absorption spectra of substances in liquid phases.

Latest Patents

Kamada holds a patent for a "Method and apparatus for spectrometric measurement of particulate." This innovative method utilizes optical resonance phenomena to measure the transient absorbance and absorption spectrum of substances at interfaces in liquid phases. The apparatus includes a pulse laser oscillator, an optical delay device, a microscope system, and a detector, enabling high-sensitivity measurements even in the presence of particulates.

Career Highlights

Throughout his career, Kenji Kamada has focused on advancing spectrometric techniques. His work has been pivotal in enhancing the sensitivity and accuracy of measurements in complex liquid environments.

Collaborations

Kamada has collaborated with notable colleagues, including Keiji Sasaki and Hiroshi Masuhara, contributing to the development of innovative spectrometric methods.

Conclusion

Kenji Kamada's contributions to spectrometric measurement highlight his role as a leading inventor in the field. His innovative methods and collaborations continue to influence advancements in scientific measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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