The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 1995
Filed:
Jan. 27, 1994
Kenji Kamada, Kyoto-shi, Kyoto, JP;
Keiji Sasaki, Otokuni-gun Kyoto, JP;
Noboru Kitamura, Kyoto-shi, Kyoto, JP;
Hiroshi Masuhara, Higashi-Osaka-shi, Osaka, JP;
Other;
Abstract
A method of spectrometry is disclosed for measuring transient absorbance and transient absorption spectrum of a substance to be measured at interfaces in liquid phase of particulates containing a fluorescent pigment and the substance to be measured by the utilization of optical resonance phenomenon. An apparatus for carrying out the method is also disclosed and comprises: (a) a pulse laser oscillator for exciting the fluorescent pigment and the substance to be measured, respectively; (b) an optical delay device for causing delay of any one of pulse laser beams of two kinds of wavelengths generated by the pulse laser oscillator; (c) a microscope system for condensing laser beams generated by the pulse laser oscillator and irradiating the condensed beams to the sample; and (d) a detector for detecting light emission of the sample. According to the method of the present invention, it is possible to measure transient absorbance and transient absorption spectrum at a high sensitivity even when particulates containing the substance to be measured in liquid phase are present.