Takatsuki, Japan

Kenji Ikesaka

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Rigaku Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Ikesaka. Retrieved from https://idiyas.com/inventor/kenji-ikesaka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 3.3

ph-index = 1


Company Filing History:


Years Active: 2026

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3 patents (USPTO):Explore Patents

Title: Kenji Ikesaka: Innovator in X-ray Emission Spectrochemical Analysis

Introduction

Kenji Ikesaka is a prominent inventor based in Takatsuki, Japan. He has made significant contributions to the field of x-ray emission spectrochemical analysis. With a total of 3 patents to his name, Ikesaka continues to push the boundaries of innovation in his area of expertise.

Latest Patents

One of his latest patents includes a measuring device specifically designed for x-ray emission spectrochemical analysis. This invention showcases his commitment to advancing analytical techniques and improving measurement accuracy in scientific research.

Career Highlights

Kenji Ikesaka is currently employed at Rigaku Corporation, a leading company in the field of analytical and measurement instruments. His work at Rigaku has allowed him to collaborate with other talented professionals and contribute to groundbreaking advancements in technology.

Collaborations

Throughout his career, Ikesaka has worked alongside notable colleagues such as Hikari Takahara and Koichi Aoyagi. These collaborations have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Kenji Ikesaka is a dedicated inventor whose work in x-ray emission spectrochemical analysis has made a lasting impact on the field. His contributions continue to inspire future innovations and advancements in analytical technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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