Location History:
- Loveland, CO (US) (2017)
- Hino, JP (2020)
Company Filing History:
Years Active: 2017-2020
Title: Kenichi Takano: Innovator in Semiconductor Testing Technology
Introduction
Kenichi Takano is a notable inventor based in Hino, Japan. He has made significant contributions to the field of semiconductor testing technology, holding 2 patents that showcase his innovative approach to improving testing systems.
Latest Patents
One of his latest patents is a semiconductor wafer test system. This system includes a cabinet housing multiple instruments, a test head with multiple pin modules, and cables connecting the instruments to the pin modules. The cabinet is designed with a front door, left and right side panels, a rear door, a ceiling unit, and a bottom unit. Each instrument features a front surface, side surfaces, and a rear surface, with at least one first connection terminal. The cabinet also defines spaces to separate intake air and exhaust air for the instruments, enhancing their efficiency.
Another significant patent is for a system and apparatus for measuring capacitance. This invention involves systems and methods for determining capacitance on a device-under-test (DUT). It includes a voltage signal generator that alternates between high and low voltage at regular intervals, causing a DUT current to flow. The current signal generator then generates a cancellation current signal to eliminate leakage current, allowing for accurate capacitance measurement.
Career Highlights
Kenichi Takano is currently employed at Keysight Technologies, Inc., where he continues to develop innovative solutions in semiconductor testing. His work has contributed to advancements in the efficiency and accuracy of testing systems.
Collaborations
He collaborates with talented coworkers, including Sumio Shimonishi and Motochika Juso, who share his commitment to innovation in technology.
Conclusion
Kenichi Takano's contributions to semiconductor testing technology through his patents reflect his dedication to innovation and excellence in the field. His work continues to influence the industry and improve testing methodologies.