Kodaira, Japan

Kenichi Tada

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenichi Tada. Retrieved from https://idiyas.com/inventor/kenichi-tada-52zwo3r6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Kenichi Tada: Innovator in Semiconductor Technology

Introduction

Kenichi Tada is a notable inventor based in Kodaira, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the analysis of integrated circuits.

Latest Patents

Kenichi Tada holds a patent for a semiconductor device designed to facilitate the analysis of the position and cause of failures in integrated circuits that adopt a polyphase clock. This innovative device includes an error detecting unit that identifies operational problems within the integrated circuit. Additionally, it features a clock state holding unit that retains phase information over a predetermined term of a two- or more-phase clock. When an error is detected, the output unit provides the relevant phase information, enhancing the reliability of integrated circuits.

Career Highlights

Kenichi Tada is associated with Hitachi, Ltd., a leading company in technology and innovation. His work has contributed to advancements in semiconductor devices, showcasing his expertise in the field.

Collaborations

Throughout his career, Kenichi has collaborated with esteemed colleagues such as Koki Tsutsumida and Masatoshi Kawashima. Their combined efforts have furthered research and development in semiconductor technology.

Conclusion

Kenichi Tada's contributions to semiconductor technology exemplify his innovative spirit and dedication to improving integrated circuit analysis. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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