The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
Jan. 13, 2011
Kenichi Tada, Kodaira, JP;
Koki Tsutsumida, Ome, JP;
Masatoshi Kawashima, Hamura, JP;
Hideki Hayashi, Ome, JP;
Tsutomu Sato, Ninomiyamachi, JP;
Koichi Sugimoto, Odawara, JP;
Kenichi Tada, Kodaira, JP;
Koki Tsutsumida, Ome, JP;
Masatoshi Kawashima, Hamura, JP;
Hideki Hayashi, Ome, JP;
Tsutomu Sato, Ninomiyamachi, JP;
Koichi Sugimoto, Odawara, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A semiconductor device is designed to facilitate analyzing a position and a cause of the failure of an integrated circuit adopting a polyphase clock. To this end, the semiconductor device is provided with an error detecting unit that detects that a problem of the operation occurs in the integrated circuit, a clock state holding unit that holds the information of phases in a predetermined term of a two- or more-phase clock and an output unit that outputs the information of the phases in the predetermined term of the two- or more-phase clock when the error detecting unit detects that the problem of the operation occurs in the integrated circuit.