Tokyo, Japan

Kenichi Myochin


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Kenichi Myochin: Innovator in Charged Particle Beam Technology

Introduction

Kenichi Myochin is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam technology. His innovative work focuses on enhancing the efficiency of charged particle detection.

Latest Patents

Myochin holds a patent for a charged particle beam device. The purpose of this invention is to reduce the loss of charged particles that occur when they collide with the interior of the device's column. The invention aims to detect charged particles with high efficiency. The device features an objective lens that focuses the charged particle beam, a detector positioned between the objective lens and the charged particle source, and a deflector that separates emitted charged particles from the beam's axis. Additionally, it includes multiple electrodes that form electrostatic lenses to focus the emitted charged particles on a deflection point.

Career Highlights

Kenichi Myochin is associated with Hitachi High-Technologies Corporation, where he continues to work on advancements in charged particle technology. His expertise and innovative approach have positioned him as a key figure in his field.

Collaborations

Myochin has collaborated with notable colleagues, including Yuzuru Mizuhara and Toshiyuki Yokosuka. Their combined efforts contribute to the ongoing development of cutting-edge technologies in the industry.

Conclusion

Kenichi Myochin's work in charged particle beam technology exemplifies the impact of innovation in scientific research. His contributions continue to advance the field and enhance the efficiency of particle detection systems.

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