Tokyo, Japan

Kengo Takeno

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi High-Tech Science Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kengo Takeno. Retrieved from https://idiyas.com/inventor/kengo-takeno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Kengo Takeno: Innovator in Charged Particle Beam Technology

Introduction: Kengo Takeno, a notable inventor based in Tokyo, Japan, has made significant contributions in the field of charged particle beam technology. With a focus on enhancing the efficiency and precision of sample positioning methods, his inventions have the potential to advance various applications in scientific research and technological development.

Latest Patents: Kengo Takeno holds a patent titled "Sample positioning method and charged particle beam apparatus." This innovative method simplifies and accelerates the positioning of a target observation area within a sample, which is placed on a sample stage inside the chamber of a charged particle beam apparatus. The patent outlines a procedure that involves displaying an image of the sample on a screen, designating an attention point, and aligning the sample stage to ensure the attention point is optimally positioned for observation.

Career Highlights: Takeno's career at Hitachi High-Tech Science Corporation has been marked by his dedication to advancing charged particle beam technologies. His work enables researchers to better analyze materials at the micro and nanoscale, opening new possibilities in various research fields. His patent reflects his commitment to precision and efficiency in scientific instruments.

Collaborations: Throughout his career, Kengo Takeno has collaborated with esteemed colleagues such as Masahiro Kiyohara and Atsushi Uemoto. These collaborations have fostered a dynamic environment for innovation, leading to advancements in technology and enhancing the capabilities of charged particle beam applications.

Conclusion: Kengo Takeno's contributions to the field of charged particle beam technology underscore his status as a forward-thinking inventor. His innovative methods improve sample positioning techniques, which are crucial for detailed scientific analysis. As he continues his work at Hitachi High-Tech Science Corporation, the impact of his inventions is likely to resonate across various industries, contributing to ongoing advancements in research and technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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