Fukuoka, Japan

Kengo Hirata

This inventor holds 1 USPTO granted patent. Top assignee: Mitutoyo Corporation. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kengo Hirata. Retrieved from https://idiyas.com/inventor/kengo-hirata-84ej4k9i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Kengo Hirata: Innovator in Measurement Technology

Introduction

Kengo Hirata is a notable inventor based in Fukuoka, Japan. He has made significant contributions to the field of measurement technology, particularly through his work at Mitutoyo Corporation. His innovative spirit and dedication to precision engineering have led to the development of valuable patents.

Latest Patents

Hirata holds a patent for an inspection gauge designed for coordinate measuring machines. This invention enhances the accuracy and efficiency of measurements, which is crucial in various manufacturing processes. His patent is a testament to his expertise and commitment to advancing measurement technology.

Career Highlights

Throughout his career, Kengo Hirata has been associated with Mitutoyo Corporation, a leading company in precision measurement instruments. His work has not only contributed to the company's reputation but has also set new standards in the industry. Hirata's innovative approach has earned him recognition among his peers.

Collaborations

Hirata has collaborated with talented individuals such as Tetsuro Hidaka and Shingo Kiyotani. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Kengo Hirata's contributions to measurement technology through his patent and work at Mitutoyo Corporation highlight his role as an influential inventor. His dedication to innovation continues to inspire advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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