This inventor holds 1 USPTO granted patent. Top assignee: Riken Corporation. Active years: 2010.
Company Filing History:
Years Active: 2010
Title: Ken Manabe - Innovator in Scanning Probe Microscopy
Introduction
Ken Manabe is a distinguished inventor based in Hyogo, Japan. He is known for his significant contributions to the field of microscopy, particularly through his innovative patent in scanning probe technology. His work has advanced the capabilities of scientific measurement at the atomic level.
Latest Patents
Ken Manabe holds a patent for a scanning probe microscope system. This system is designed to identify elements with atomic scale spatial resolution. It features an X-ray irradiation means that utilizes high-brilliance monochromatic X-rays with a beam diameter smaller than 1 mm. The system includes a probe that opposes the measurement object, a processing means for detecting and processing a tunneling current through the probe, and an alignment means for moving the measurement object, the probe, and the incident position of the X-rays relative to each other.
Career Highlights
Ken Manabe is currently employed at RIKEN Corporation, a leading research institution in Japan. His work at RIKEN has allowed him to collaborate with other prominent scientists and contribute to groundbreaking research in microscopy.
Collaborations
Throughout his career, Ken has worked alongside notable colleagues such as Yuji Kuwahara and Masakazu Aono. These collaborations have enriched his research and expanded the impact of his innovations in the scientific community.
Conclusion
Ken Manabe's contributions to scanning probe microscopy exemplify the importance of innovation in scientific research. His patented technology continues to influence the field, showcasing the potential of advanced measurement techniques.