The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2010
Filed:
Mar. 16, 2006
Akira Saito, Hyogo, JP;
Masakazu Aono, Hyogo, JP;
Yuji Kuwahara, Hyogo, JP;
Jyunpei Maruyama, Hyogo, JP;
Ken Manabe, Hyogo, JP;
Akira Saito, Hyogo, JP;
Masakazu Aono, Hyogo, JP;
Yuji Kuwahara, Hyogo, JP;
Jyunpei Maruyama, Hyogo, JP;
Ken Manabe, Hyogo, JP;
Riken, Wako, JP;
Abstract
A scanning probe microscope system capable of identifying an element with atomic scale spatial resolution comprises: an X-ray irradiation means for irradiating a measurement object with high-brilliance monochromatic X-rays having a beam diameter smaller than 1 mm; a probe arranged to oppose to the measurement object; a processing means for detecting and processing a tunneling current through the probe; and a scanning probe microscope having an alignment means for relatively moving the measurement object, the probe, and the incident position of the high-brilliance monochromatic X-rays to the measurement object.