Tsukuba, Japan

Ken'ichi Kimijima

This inventor holds 1 USPTO granted patent. Top assignee: Inter-University Research Institute Corporation High Energy Accelerator Research Organization. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ken'ichi Kimijima. Retrieved from https://idiyas.com/inventor/ken-ichi-kimijima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Ken'ichi Kimijima and Advances in X-Ray Analysis

Introduction

Ken'ichi Kimijima is an inventor associated with Tsukuba, Japan, and the High Energy Accelerator Research Organization. His work includes an invention designed to enable complementary X-ray measurements of a sample at the same location.

Latest Patents

Kimijima is credited with 1 patent: “Cell for X-ray Analysis and X-Ray Analysis Apparatus.” The invention describes a cell that enables simultaneous X-ray diffraction and X-ray absorption fine structure measurements within the same field of view on a sample.

The cell includes a furnace that holds and heats the sample with a focused heater, windows for incoming and outgoing X-rays, and a holder that positions the sample. Its arrangement allows X-ray diffraction measurements outside the second window while X-ray absorption fine structure measurements are made through a third window. This design supports simultaneous analysis of the same sample position.

Career Highlights

Kimijima’s listed patent reflects work on instrumentation for X-ray analysis. By combining two measurement techniques in one setup, the invention is intended to provide complementary information about a material under study.

Collaborations

The listed coworkers associated with Kimijima include Masao Kimura and Daiji Asahara. His organization is the High Energy Accelerator Research Organization, an inter-university research institute corporation in Japan.

Conclusion

Ken'ichi Kimijima’s patent presents an X-ray analysis cell designed to perform diffraction and absorption fine structure measurements simultaneously at the same sample location.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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