Keith M Jones

Title: Keith M. Jones: Innovator in Scanning Capacitance Microscopy

Introduction

Keith M. Jones is a notable inventor based in Cary, NC (US). He has made significant contributions to the field of microscopy through his innovative patent. His work focuses on advancing the techniques used in scanning capacitance microscopy and spectroscopy.

Latest Patents

Keith M. Jones holds a patent for an "Apparatus and method for scanning capacitance microscopy and spectroscopy." This invention describes an apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface. A high-frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atomic force microscope. Data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. The patent outlines methods for imaging tip-sample capacitance and conducting spectroscopic measurements at a single point on the sample. Additionally, it describes a method for system calibration.

Career Highlights

Keith M. Jones is associated with Asylum Research Corporation, where he applies his expertise in microscopy. His work has contributed to the advancement of techniques that enhance the capabilities of scanning probe microscopy.

Collaborations

He has collaborated with notable colleagues, including Maarten Rutgers and William H. Hertzog, to further develop innovative solutions in the field.

Conclusion

Keith M. Jones is a distinguished inventor whose work in scanning capacitance microscopy has paved the way for advancements in the field. His contributions continue to influence the development of innovative microscopy techniques.