Atsugi, Japan

Keita Masuhara

USPTO Granted Patents = 4 

Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2009-2019

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4 patents (USPTO):Explore Patents

Title: Keita Masuhara: Innovator in Measurement Technology

Introduction

Keita Masuhara is a prominent inventor based in Atsugi, Japan. He has made significant contributions to the field of measurement technology, holding a total of 4 patents. His work focuses on developing innovative devices and methods that enhance measurement processes.

Latest Patents

Masuhara's latest patents include a measuring apparatus and a measurement parameter input control device. The measuring apparatus features a transmission and reception unit that wirelessly communicates with devices under test (DUTs). It includes a measurement unit that receives data from the DUTs, measures them based on the received data, and outputs measurement results. Additionally, it has a display unit that shows predetermined information regarding the measurement and a disconnection-related information acquisition unit that gathers information about disconnection reasons. The measurement parameter input control device allows for intuitive changes to measurement parameters necessary for various measuring processes, enhancing operability.

Career Highlights

Keita Masuhara is currently employed at Anritsu Corporation, where he continues to innovate in measurement technology. His work has been instrumental in advancing the capabilities of measurement devices, making them more efficient and user-friendly.

Collaborations

Masuhara has collaborated with notable colleagues, including Tadanori Nishikobara and Norio Nakayama. Their combined expertise has contributed to the successful development of various measurement technologies.

Conclusion

Keita Masuhara's contributions to measurement technology through his patents and collaborations highlight his role as an influential inventor in the field. His innovative approaches continue to shape the future of measurement devices.

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