Tokyo, Japan

Keisuke Yamaya

This inventor holds 1 USPTO granted patent. Top assignee: Ntt Docomo, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keisuke Yamaya. Retrieved from https://idiyas.com/inventor/keisuke-yamaya-q16d2b86

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Keisuke Yamaya: Image Recognition Innovation

Introduction

Keisuke Yamaya is an inventor associated with Tokyo, Japan, and NTT DOCOMO, Inc. His patent work includes an image recognition device designed to improve the accuracy of recognizing objects from images.

Latest Patents

Yamaya is associated with 1 patent, titled “Image Recognition Device.” The invention uses an imaging device to capture one surface of a recognition target and a mirror unit to reflect another surface toward the camera. A recognition unit then identifies the target using images of both surfaces.

By capturing multiple surfaces in one imaging operation, the device can improve recognition accuracy. It can also image a target from at least two directions when the target has been rolled or placed in an unexpected orientation.

Career Highlights

Yamaya’s listed patent work is connected with NTT DOCOMO, Inc. The image recognition device reflects an approach to machine vision that combines direct imaging with reflected views to provide more information about a target.

Collaborations

Yamaya’s listed coworker is Takuya Kitade. The available information identifies their association but does not specify further details about their collaboration.

Conclusion

Keisuke Yamaya’s image recognition device uses images of multiple target surfaces to support more reliable recognition, including when an object is positioned unexpectedly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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