Itami, Japan

Keiko Nishitsuji

This inventor holds 1 USPTO granted patent. Top assignee: Renesas Electronics Corporation. Active years: 2011.


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2011

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Keiko Nishitsuji: Innovator in Semiconductor Technology

Introduction: Keiko Nishitsuji is a prominent inventor based in Itami, Japan. She has made significant contributions to the field of semiconductor technology. Her innovative work has led to the development of a unique method for manufacturing semiconductor devices.

Latest Patents: Keiko holds 1 patent for her invention titled "Method of manufacturing semiconductor device including forming inter-layer insulating film on semiconductor substrate." This patent details a process where a first metal film is formed on an inter-layer insulating film, followed by the formation of a first resist. Anisotropic etching is performed using the first resist as a mask, and subsequent steps involve the formation of a second metal film and additional etching processes to create bonding pads and upper layer wiring.

Career Highlights: Keiko Nishitsuji has established herself as a key figure in semiconductor innovation. Her work at Renesas Electronics Corporation has been instrumental in advancing semiconductor manufacturing techniques. She has demonstrated a strong commitment to research and development in this critical technology sector.

Collaborations: Keiko has worked alongside notable colleagues such as Kazunobu Miki and Katsuhiro Hasegawa. Their collaborative efforts have contributed to the success of various projects within the semiconductor industry.

Conclusion: Keiko Nishitsuji's contributions to semiconductor technology exemplify her innovative spirit and dedication to advancing the field. Her patent and work at Renesas Electronics Corporation highlight her role as a leading inventor in this vital area of technology.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…