Kamisato, Japan

Keiji Kato

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keiji Kato. Retrieved from https://idiyas.com/inventor/keiji-kato-gc7f7h7v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Keiji Kato: Innovator in Optical Inspection Technology

Introduction

Keiji Kato is a notable inventor based in Kamisato, Japan. He has made significant contributions to the field of optical inspection technology. His innovative approach has led to the development of methods that enhance the detection of surface defects in various substrates.

Latest Patents

Kato holds a patent for an "Optical inspection method and its apparatus." This invention provides a sophisticated optical inspection method capable of detecting finer defects on the surface of a substrate. The method includes several steps: irradiating a rotating and continuously moving sample surface with illumination light at an oblique angle, detecting images of light formed by forward scattering while excluding regular-reflection light, condensing and detecting lateral scattering light, and processing the signals to extract defects, including scratches.

Career Highlights

Keiji Kato is associated with Hitachi High-Technologies Corporation, where he has applied his expertise in optical inspection. His work has been instrumental in advancing the capabilities of inspection technologies used in various industries.

Collaborations

Kato has collaborated with notable colleagues such as Shigeru Serikawa and Bin Abdulrashid Fariz. These collaborations have contributed to the development and refinement of innovative technologies in optical inspection.

Conclusion

Keiji Kato's contributions to optical inspection technology exemplify the impact of innovation in enhancing defect detection methods. His work continues to influence the industry and improve quality assurance processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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