Fukui, Japan

Keiichirou Tabata

This inventor holds 1 USPTO granted patent. Top assignee: Seiren Company, Ltd. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keiichirou Tabata. Retrieved from https://idiyas.com/inventor/keiichirou-tabata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Keiichirou Tabata: Innovator in Color Inspection Technology

Introduction

Keiichirou Tabata is a notable inventor based in Fukui, Japan. He has made significant contributions to the field of color inspection technology, particularly in textile products. His innovative approach has led to the development of a system that enhances the accuracy of color inspections.

Latest Patents

One of Keiichirou Tabata's key patents is a color inspection system. This system is designed to determine pass or fail criteria with accuracy comparable to visual inspections. It is particularly effective for various textile products, including raised cloth and those with intricate printed patterns. The system utilizes a spectroradiometer to measure color values from a specific angle, ensuring precise results.

Career Highlights

Keiichirou Tabata is currently associated with Seiren Company, Ltd., where he continues to innovate in the field of color inspection. His work has been instrumental in advancing the technology used in textile quality control.

Collaborations

Throughout his career, Keiichirou has collaborated with notable colleagues, including Takao Ebita and Masahiro Matsumura. These collaborations have further enriched his contributions to the industry.

Conclusion

Keiichirou Tabata's work in developing a sophisticated color inspection system showcases his dedication to innovation in textile technology. His contributions have significantly improved the accuracy of color assessments in various textile products.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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