The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Mar. 29, 2006
Takao Ebita, Fukui, JP;
Norihiro Ogata, Fukui, JP;
Masahiro Matsumura, Fukui, JP;
Keiichirou Tabata, Fukui, JP;
Takao Ebita, Fukui, JP;
Norihiro Ogata, Fukui, JP;
Masahiro Matsumura, Fukui, JP;
Keiichirou Tabata, Fukui, JP;
Seiren Co., Ltd., Fukui-shi, JP;
Abstract
A color inspection system capable of making a determination on pass or failure with accuracy equivalent to that for the case of a visual inspection even in the case of inspecting various textile products as measurement targets, such as raised cloth, cloth with printed patterns such as a marbled pattern, moire pattern and detailed pattern is provided. With the color inspection system, an illuminant is set to shine a light on the surface of a textile product placed on the top surface of a measuring platform to thereby make measurements from a direction at an angle of 45 degrees from the surface of a measuring region of the textile product by use of a spectroradiometer of a measuring unit. The spectroradiometer is provided with a wide range lens attached thereto to thereby expand a measuring region. The results of measurement by the spectroradiometer are inputted to an information processor of a determination unit. The information processor computes color values for the whole measuring region to be compared with standard color values stored in a memory to thereby make a determination on pass or fail.