This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignee: Surpass Industry Co., Ltd.. Active years: 2004-2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004-2010
Title: Keiichi Matsushima: Innovator in Flow Measurement Technologies
Introduction
Keiichi Matsushima is a notable inventor based in Gyoda, Japan. He has made significant contributions to the field of flow measurement technologies, holding a total of 3 patents. His innovative work has paved the way for advancements in various measurement methods.
Latest Patents
Matsushima's latest patents include a heat signal writing device designed to form a clear writing pattern of a heat signal. This device utilizes a Peltier element to create temperature changes according to a desired pattern by heating or cooling. It features a channel supporting member shaped like a pyramid, which is made of a heat conductive material and is in close contact with the Peltier element. Additionally, he has developed a flow rate measurement method and an ultrasonic flow meter that accurately measures flow velocity by utilizing ultrasonic waves. This method involves preparing a reference ultrasonic velocity and correcting the temporary flow velocity to determine an accurate flow rate of the fluid.
Career Highlights
Matsushima is currently associated with Surpass Industry Co., Ltd., where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the accuracy and efficiency of flow measurement systems.
Collaborations
Matsushima has collaborated with notable coworkers, including Eisaku Komatsu and Michio Ohkawa. Their combined expertise has contributed to the success of various projects and innovations.
Conclusion
Keiichi Matsushima's contributions to flow measurement technologies highlight his role as a leading inventor in the field. His innovative patents and collaborations reflect his commitment to advancing measurement methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
