The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2004

Filed:

Dec. 18, 2001
Applicant:
Inventors:

Keiichi Matsushima, Gyoda, JP;

Michio Ohkawa, Gyoda, JP;

Eisaku Komatsu, Gyoda, JP;

Assignee:

Surpass Industry Co., Ltd., Saitama-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/66 ;
U.S. Cl.
CPC ...
G01F 1/66 ;
Abstract

An flow rate measurement method and a ultrasonic flow meter is provided, which can measure a flow velocity accurately by utilizing a ultrasonic wave having a frequency by which a phase difference becomes zero. According to the flow rate measurement method, a reference ultrasonic velocity is prepared such that the fluid is in a standard condition, firstly. Then, an absolute ultrasonic velocity in the fluid and a temporary flow velocity V in the fluid are obtained. Then, the temporary flow velocity V is corrected by using the difference between the reference ultrasonic velocity and the absolute ultrasonic velocity thereby to determine an accurate flow velocity of the fluid, and to determine a flow rate of the fluid by using the accurate flow velocity and a cross section area of the conduit.


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Matsushima, Keiichi. (2004). Flow rate measurement method, ultrasonic flow rate meter, flow velocity measurement method, temperature or pressure measurement method, ultrasonic thermometer and ultrasonic pressure gage (U.S. Patent No. 6708570). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6708570

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