Kedar Grama

Title: Kedar Grama: Innovator in Machine Learning and Semiconductor Inspection

Introduction

Kedar Grama is a notable inventor based in Fremont, CA, who has made significant contributions to the fields of machine learning and semiconductor inspection. With a total of 2 patents, his work focuses on enhancing image resolution and defect classification in semiconductor manufacturing.

Latest Patents

One of Kedar's latest patents involves training a machine learning model to generate higher resolution images from inspection images. This innovative method includes a pre-training step using simulated images and a re-training step with actual images of a test specimen. The resulting higher resolution images can be utilized for applications such as nuisance filtering and defect classification. Another patent focuses on optical-mode selection for multi-mode semiconductor inspection. This process involves scanning semiconductor wafers to identify defects and classifying them based on electron microscope reviews. The method enhances defect detection by using a combination of primary and secondary optical modes.

Career Highlights

Kedar Grama is currently employed at Kla Corporation, where he applies his expertise in machine learning and semiconductor technology. His work has been instrumental in advancing the capabilities of inspection systems in the semiconductor industry.

Collaborations

Kedar collaborates with talented professionals such as Bjorn Brauer and Richard Wallingford, contributing to a dynamic work environment that fosters innovation and excellence.

Conclusion

Kedar Grama's contributions to machine learning and semiconductor inspection demonstrate his commitment to advancing technology in these fields. His innovative patents and collaborative efforts continue to impact the industry positively.