Ehime, Japan

Kazuyuki Nakahata

This inventor holds 1 USPTO granted patent. Top assignees: Ehime University, Mitsubishi Heavy Industries Limited. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuyuki Nakahata. Retrieved from https://idiyas.com/inventor/kazuyuki-nakahata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Kazuyuki Nakahata: Innovator in Ultrasonic Inspection Technology

Introduction

Kazuyuki Nakahata is a notable inventor based in Ehime, Japan. He has made significant contributions to the field of ultrasonic inspection technology. His innovative approach has led to the development of a unique ultrasonic inspection method that enhances the accuracy and efficiency of inspections.

Latest Patents

Nakahata holds a patent for an ultrasonic inspection method, ultrasonic inspection device, and computer-readable storage medium. This method involves scanning and inspecting an object using ultrasonic waves. It includes collecting data from ultrasonic signals transmitted and received by probes. The data is then processed and synthesized to depict an image of the object's surface. This image is created using pixels arranged in a grid-like fashion, allowing for the identification of surface shapes based on pixel intensity.

Career Highlights

Throughout his career, Nakahata has worked with prominent organizations such as Mitsubishi Heavy Industries Limited and Ehime University. His experience in these institutions has contributed to his expertise in ultrasonic technology and innovation.

Collaborations

Nakahata has collaborated with notable colleagues, including Kyohei Hayashi and Masakazu Kamibayashi. Their joint efforts have further advanced the field of ultrasonic inspection.

Conclusion

Kazuyuki Nakahata's contributions to ultrasonic inspection technology demonstrate his innovative spirit and dedication to improving inspection methods. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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