The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Mar. 08, 2019
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
National University Corporation Ehime University, Ehime, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
NATIONAL UNIVERSITY CORPORATION EHIME UNIVERSITY, Ehime, JP;
Abstract
An ultrasonic inspection method of scanning and inspecting an inspection object with ultrasonic waves includes collecting data obtained by scanning the inspection object with ultrasonic signals by using probes configured to transmit and receive the ultrasonic signals to and from the inspection object via a medium that propagates the ultrasonic signals; and processing and synthesizing the collected data. Synthesizing the data includes depicting an image including a surface of the inspection object in a region including pixels partitioned in a grid-like fashion based on the collected data of the ultrasonic signals, and extracting a pixel having maximum pixel intensity from the pixels arranged along a direction perpendicular to an extending direction of the surface of the inspection object in the depicted image to identify a position of the extracted pixel as a surface shape of the inspection object.