Ome, Japan

Kazuyoshi Arai

This inventor holds 1 USPTO granted patent. Top assignee: Tera Probe, Inc.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuyoshi Arai. Retrieved from https://idiyas.com/inventor/kazuyoshi-arai-cepye2z2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Kazuyoshi Arai: Innovator in Semiconductor Technology

Introduction

Kazuyoshi Arai is a notable inventor based in Ome, Japan. He has made significant contributions to the field of semiconductor technology. His work focuses on enhancing the efficiency and functionality of semiconductor devices.

Latest Patents

Kazuyoshi Arai holds a patent for a semiconductor device featuring a multilayer wiring structure. The patent, titled "Semiconductor device having multilayer wiring structure and manufacturing method of the same," describes a semiconductor device that includes a semiconductor chip, a multilayer wiring structure stacked on the chip, and an electronic component embedded within the wiring structure. This innovation aims to improve the performance and integration of electronic components in semiconductor devices. He has 1 patent to his name.

Career Highlights

Kazuyoshi Arai is currently associated with Tera Probe, Inc., where he continues to work on advancing semiconductor technologies. His expertise in multilayer wiring structures has positioned him as a key player in the semiconductor industry.

Conclusion

Kazuyoshi Arai's contributions to semiconductor technology through his innovative patent demonstrate his commitment to enhancing electronic devices. His work at Tera Probe, Inc. continues to influence the future of semiconductor development.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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