Yokohama Kanagawa, Japan

Tera Probe, Inc.


USPTO Granted Patents = 8

Trademarks = 5

Forward Citations = 4

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7 inventors (with patents filed for the assignee):

goldMedal Takeshi Wakabayashi (5 out of 41 patents)

silverMedal Shinji Wakisaka (4 out of 20 patents)

bronzeMedal Ichiro Mihara (3 out of 44 patents)

4 Aiko Mizusawa (2 out of 5 patents)

5 Osamu Okada (2 out of 11 patents)

6 Kazuyoshi Arai (1 out of 1 patent)

7 Ichiro Kouno (1 out of 1 patent)


8 patents:

Tera Probe, Inc. is a leading provider of advanced wafer testing solutions for the semiconductor industry. With a strong focus on innovation and quality, the company offers a wide range of probing technologies to meet the exacting demands of modern semiconductor manufacturing. From MEMS devices to advanced packaging, Tera Probe has the expertise and technology to ensure the highest levels of performance and reliability for its customers.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 23 2025

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8 Patents

#1 in Yokohama Kanagawa

#4,917 in Japan

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Yokohama Kanagawa, Japan
Forward Citations = 4

7 inventors:

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