Yokohama, Japan

Tera Probe, Inc.

USPTO Granted Patents = 8

% Expired Patents = 12.5

Trademarks = 5

Forward Citations = 4

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7 inventors (with patents filed for the assignee):

goldMedal Takeshi Wakabayashi (5 out of 41 patents)

silverMedal Shinji Wakisaka (4 out of 20 patents)

bronzeMedal Ichiro Mihara (3 out of 44 patents)

4.  Aiko Mizusawa (2 out of 5 patents)

5.  Osamu Okada (2 out of 11 patents)

6.  Kazuyoshi Arai (1 out of 1 patent)

7.  Ichiro Kouno (1 out of 1 patent)


8 patents:

Company Overview
Tera Probe, Inc. is a leading provider of advanced wafer testing solutions for the semiconductor industry. With a strong focus on innovation and quality, the company offers a wide range of probing technologies to meet the exacting demands of modern semiconductor manufacturing. From MEMS devices to advanced packaging, Tera Probe has the expertise and technology to ensure the highest levels of performance and reliability for its customers.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

Tera Probe, Inc. USPTO Patent Assignee Logo
8 Patents

#92 in Yokohama

#5,049 in Japan

Yokohama, JP
Yokohama, Japan
Forward Citations = 4

7 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Tera Probe, Inc.. Retrieved from https://idiyas.com/company/tera-probe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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