Tokyo, Japan

Kazuo Yamanaka

This inventor holds 1 USPTO granted patent. Top assignee: Agilent Technologies, Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuo Yamanaka. Retrieved from https://idiyas.com/inventor/kazuo-yamanaka-klokjd2w

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 2.0

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Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Kazuo Yamanaka: Innovator in Mass Spectrometry

Introduction

Kazuo Yamanaka is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of mass spectrometry, particularly in the development of methods that enhance measurement accuracy and efficiency. His innovative approach has garnered attention in the scientific community.

Latest Patents

Kazuo Yamanaka holds a patent for a method to generate data acquisition methods for mass spectrometry. This process automates the creation of measurement methods suitable for plasma ion source mass spectrometry. The patent includes several key steps, such as semi-quantitatively measuring all elements in a sample, determining plasma conditions based on total concentrations, and estimating signal strengths and concentrations of elements. The method ultimately creates mass spectrometry protocols that optimize various parameters, including plasma conditions and integration times.

Career Highlights

Yamanaka is currently associated with Agilent Technologies, Inc., where he continues to advance research in mass spectrometry. His work focuses on improving analytical techniques that are crucial for various applications in scientific research and industry.

Collaborations

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Conclusion

Kazuo Yamanaka's contributions to mass spectrometry exemplify the impact of innovative thinking in scientific research. His patented methods are paving the way for more accurate and efficient measurement techniques in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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