This inventor holds 2 USPTO granted patents. Top assignee: Rikagaku Kenkyusho. Active years: 1990-1991.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990-1991
Title: Kazuo Shimizu: Innovator in Plasma Measurement Technology
Introduction
Kazuo Shimizu is a notable inventor based in Kashiwa, Japan. He has made significant contributions to the field of plasma measurement technology, holding 2 patents that showcase his innovative approach to scientific challenges.
Latest Patents
Shimizu's latest patents include an "Apparatus for measuring electron temperature" and an "Apparatus for detecting contamination on probe surface." The first patent describes a device that measures the electron temperature of plasma by utilizing a first probe to detect floating potential. Two distinct voltage pulses are added to this potential and applied to the plasma via a second probe, allowing for the calculation of electron temperature based on the detected currents. The second patent focuses on detecting contamination on probe surfaces. It features a sweep voltage generator, a probe current detection circuit, and an amplitude discriminator, which together evaluate the degree of contamination based on the differences in sweep voltages.
Career Highlights
Kazuo Shimizu is currently employed at Rikagaku Kenkyusho, where he continues to develop innovative technologies in plasma measurement. His work has been instrumental in advancing the understanding of plasma behavior and its applications.
Collaborations
Shimizu has collaborated with notable colleagues such as Hiroshi Amemiya and Yuichi Sakamoto. Their combined expertise has contributed to the success of various projects within their research institution.
Conclusion
Kazuo Shimizu's contributions to plasma measurement technology through his patents and collaborations highlight his role as an influential inventor in his field. His work continues to pave the way for advancements in scientific research and applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile