This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 834,708 Years Active: 2003
Title: Kazuo Onuma and His Patent for Evaluating Silicon Melt Surfaces.
Introduction
Kazuo Onuma is an inventor associated with Ibaraki, Japan. His patent work includes a method and system for evaluating a silicon melt surface without contact.
Latest Patents
The provided information lists one patent for Onuma: “Non-contact silicon melt surface evaluation method and system.” The invention splits light from a source into an evaluation signal and a reference signal. These signals are directed onto a sample surface and a reference surface made of the same material. The reflected signals are then made to interfere, enabling analysis of the sample surface. Onuma is credited with 1 patent.
Career Highlights
Onuma’s listed patent focuses on optical measurement and non-contact evaluation of silicon melt surfaces. The supplied information identifies his company as “Other,” so no company is included here.
Collaborations
The provided information names Shin Nakamura and Taketoshi Hibiya as Onuma’s coworkers.
Conclusion
Kazuo Onuma’s listed invention applies interference between reflected light signals to evaluate a silicon melt surface without direct contact.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile