Musashino, Japan

Kazunaga Ohno


Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 22(Granted Patents)


Location History:

  • Tokyo, JP (1997)
  • Musashino, JP (2000)

Company Filing History:


Years Active: 1997-2000

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2 patents (USPTO):Explore Patents

Title: Kazunaga Ohno: Innovator in X-ray Technology

Introduction

Kazunaga Ohno, located in Musashino, Japan, is a distinguished inventor with two noteworthy patents to his name. His innovative contributions primarily focus on advancements in X-ray technology, improving accuracy and efficiency in analytical applications.

Latest Patents

Ohno's latest patents include an X-ray analyzing apparatus and an apparatus for measuring the sulfur component contained in oil. The X-ray analyzing apparatus features an excitation ray generator that applies an excitation ray onto a sample. It is equipped with a vacuum-sealed X-ray detector and cooling device, which ensures optimal performance. The design incorporates two X-ray passing layers, allowing the characteristic X-ray generated from the sample to reach the detector efficiently while preventing gas interference in the vacuum container.

The apparatus for measuring sulfur in oil includes an X-ray tube with a target made of Titanium or Scandium, combined with a filter of the same materials. This design minimizes background X-ray interference, enabling accurate detection of even trace amounts of sulfur in oil samples.

Career Highlights

Throughout his career, Kazunaga Ohno has been associated with prominent companies such as DKK Corporation and JEOL Ltd., where he has contributed his expertise in developing cutting-edge X-ray technologies. His work has significantly impacted the field of material analysis and measurement.

Collaborations

Ohno has collaborated with esteemed colleagues, including Yukio Hashizume and Masahiko Kuwata. Together, they have combined their skills and knowledge to further advance innovations in X-ray applications.

Conclusion

Kazunaga Ohno's innovative spirit and commitment to enhancing X-ray technology have made him a respected figure in his field. His patents not only reflect his technical prowess but also his dedication to improving analytical precision in scientific research and industry applications.

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