Tokyo, Japan

Kazuma Ogawa

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2018-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuma Ogawa. Retrieved from https://idiyas.com/inventor/kazuma-ogawa-th2v7dgh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2018-2019

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2 patents (USPTO):Explore Patents

Title: Kazuma Ogawa: Pioneer of High-Precision Inspection Devices

Introduction: Kazuma Ogawa is an innovative inventor based in Tokyo, Japan, known for his significant contributions to the field of inspection technology. With two patents to his name, Ogawa has focused on enhancing the accuracy and efficiency of foreign matter detection in various applications. His work not only reflects his technical expertise but also showcases his commitment to advancing the capabilities of inspection devices.

Latest Patents: Among his recent achievements, Ogawa's latest patents include an advanced examination device. This cutting-edge device is designed to detect foreign matter with high precision. The inspection device comprises a light source, an electro-optic element that alters the phase of the incident light into at least two states, and a controller. The controller plays a critical role by correcting phase fluctuations of the electro-optic element itself. It utilizes the intensity modulation characteristics of the electro-optic element, which are achieved by varying the applied voltage. This innovative design positions Ogawa's examination device at the forefront of technological advancements in the inspection industry.

Career Highlights: Kazuma Ogawa has built a distinguished career at Hitachi High-Technologies Corporation, a global leader in advanced technology solutions. His tenure at the company has allowed him to leverage his skills and creativity in developing high-performance inspection devices. Through his innovative thinking, Ogawa has contributed significantly to the enhancement of product quality and safety across various sectors.

Collaborations: At Hitachi High-Technologies Corporation, Ogawa collaborates with esteemed colleagues such as Masami Makuuchi and Akira Hamamatsu. Working alongside these talented individuals fosters a dynamic environment that encourages innovation and drives the development of groundbreaking technologies. Their collective efforts exemplify the collaboration that is vital in the tech industry.

Conclusion: Kazuma Ogawa is a notable inventor whose work in high-precision inspection devices has made a meaningful impact on technology. His patents demonstrate a dedication to improving detection capabilities, showcasing both technical and innovative prowess. As the technology landscape continues to evolve, Ogawa’s contributions will undoubtedly stand as a testament to the potential of innovation in enhancing safety and quality across various fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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