Tokyo, Japan

Kazuki Omoto

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignees: Daiichi Kigenso Kagaku Kogyo Co., Ltd., Rigaku Corporation, Tokyo Institute of Technology. Active years: 2017-2022.


% Patents Active = 50.0


Average Co-Inventor Count = 3.7

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Tokyo, JP (2017)
  • Akishima, JP (2022)

Company Filing History:


Years Active: 2017-2022

Loading Chart...
Loading Chart...
2 patents (USPTO):Explore Patents

Title: Kazuki Omoto: Innovator in X-ray Analysis Technology

Introduction

Kazuki Omoto is a notable inventor based in Akishima, Japan. He has made significant contributions to the field of X-ray analysis technology. His innovative work has led to the development of a unique X-ray analysis apparatus.

Latest Patents

Kazuki Omoto holds a patent for an X-ray analysis apparatus. This apparatus includes a goniometer with an incident-side arm, a fixing portion, and a receiving-side arm. It features an X-ray source portion that generates an X-ray source extending in a direction that crosses the first direction. The apparatus also includes a support base for holding a sample, a parallel slit to limit the line width of the X-ray source, and a detector to detect scattered X-rays generated by the sample. He has 1 patent to his name.

Career Highlights

Kazuki Omoto is associated with Rigaku Corporation, a company known for its advancements in analytical and measurement technologies. His work at Rigaku has positioned him as a key player in the development of innovative X-ray analysis solutions.

Collaborations

Kazuki has collaborated with notable colleagues, including Takeshi Osakabe and Tetsuya Ozawa. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Kazuki Omoto's contributions to X-ray analysis technology exemplify the spirit of innovation. His patent and work at Rigaku Corporation highlight his role as a significant inventor in this field.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…