Osaka, Japan

Kazuki Matsufuji

This inventor holds 2 USPTO granted patents and 7 published patent applications. Top assignee: Rigaku Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuki Matsufuji. Retrieved from https://idiyas.com/inventor/kazuki-matsufuji

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Kazuki Matsufuji: Innovator in X-ray Emission Spectrochemical Analysis

Introduction

Kazuki Matsufuji is a prominent inventor based in Osaka, Japan. He has made significant contributions to the field of x-ray emission spectrochemical analysis. With a total of 2 patents to his name, Matsufuji continues to push the boundaries of innovation in his area of expertise.

Latest Patents

Matsufuji's latest patents include a measuring device specifically designed for x-ray emission spectrochemical analysis. This innovative device enhances the accuracy and efficiency of spectrochemical measurements, making it a valuable tool in various scientific applications.

Career Highlights

Kazuki Matsufuji is currently employed at Rigaku Corporation, a leading company in the field of analytical and industrial instrumentation. His work at Rigaku has allowed him to collaborate with other talented professionals and contribute to groundbreaking advancements in technology.

Collaborations

Matsufuji has worked alongside notable colleagues such as Hikari Takahara and Kenji Ikesaka. Their combined expertise has fostered a collaborative environment that encourages innovation and the development of new technologies.

Conclusion

Kazuki Matsufuji is a dedicated inventor whose work in x-ray emission spectrochemical analysis has made a significant impact in his field. His contributions continue to inspire advancements in scientific instrumentation and analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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