Nagasaki, Japan

Kazuhiro Sasano

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Electric Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuhiro Sasano. Retrieved from https://idiyas.com/inventor/kazuhiro-sasano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Kazuhiro Sasano: Innovator in Semiconductor Technology

Introduction

Kazuhiro Sasano is a notable inventor based in Nagasaki, Japan. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a unique semiconductor inspection jig.

Latest Patents

Kazuhiro Sasano holds 1 patent for his invention of a semiconductor inspection jig. This jig includes a base on which a semiconductor device is placed, and a substrate provided on the base that includes a conductive pattern. The conductive pattern intersects with a lead of the semiconductor device from a direction other than horizontal, making contact with an intermediate part of the lead without touching the leading end.

Career Highlights

Kazuhiro Sasano is currently employed at Mitsubishi Electric Corporation, a leading company in the electronics industry. His work at Mitsubishi Electric has allowed him to focus on advancing semiconductor technologies and improving inspection methods.

Collaborations

Throughout his career, Kazuhiro has collaborated with talented individuals such as Masayuki Kubota and Yuji Kobayashi. These collaborations have contributed to the success of his projects and innovations.

Conclusion

Kazuhiro Sasano's contributions to semiconductor technology exemplify the importance of innovation in the electronics field. His patent for the semiconductor inspection jig showcases his expertise and commitment to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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