Tokyo, Japan

Kayo Chaen

This inventor holds 1 USPTO granted patent. Top assignee: Hoya Corporation. Active years: 2024.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Kayo Chaen: Innovator in Semiconductor Technology

Introduction

Kayo Chaen is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology. His innovative work focuses on the development of substrates with multilayer reflective films, which are essential for manufacturing reflective masks.

Latest Patents

Kayo Chaen holds a patent for a substrate with a multilayer reflective film, reflective mask blank, reflective mask, and method for manufacturing semiconductor devices. This patent addresses the need for a substrate that maintains the performance of reflective masks, even when impurities are present in the thin film. The substrate consists of a main surface with at least one thin film, which includes a matrix material and a small-amount material. The patent specifies that the ratio of secondary ion intensity of the small-amount material to that of the matrix material should be more than 0 and 0.300 or less when measured by time-of-flight secondary ion mass spectrometry (TOF-SIMS).

Career Highlights

Kayo Chaen is currently employed at Hoya Corporation, a leading company in optical products and semiconductor manufacturing. His work at Hoya has allowed him to focus on advancing technologies that enhance the efficiency and effectiveness of semiconductor devices.

Collaborations

Kayo Chaen collaborates with Kota Suzuki, a talented female coworker. Together, they work on innovative projects that push the boundaries of semiconductor technology.

Conclusion

Kayo Chaen is a prominent inventor whose work in semiconductor technology has led to valuable patents and advancements in the field. His contributions continue to influence the industry and pave the way for future innovations.

Profile summary based on public USPTO records.
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