This inventor holds 1 USPTO granted patent. Top assignee: Orbital Insight, Inc.. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Innovations of Kaushik Patnaik in Aircraft Classification
Introduction
Kaushik Patnaik is an innovative inventor based in Cupertino, CA. He has made significant contributions to the field of aircraft classification through his patented technology. His work focuses on utilizing machine learning to enhance the accuracy of aircraft identification from aerial imagery.
Latest Patents
Kaushik Patnaik holds a patent for a system and method titled "Aircraft classification from aerial imagery." This invention involves a sophisticated process where an aerial image of a geographic area containing one or more aircraft is analyzed. The system inputs the aerial image into a machine learning model, which generates outputs for each aircraft. Based on these outputs, the system determines a set of geometric measurements and compares them to known sets of measurements. This comparison allows the system to identify a known set of geometric measurements, which is then mapped to a sub-classification in a database. The final output is the sub-classification of the aircraft.
Career Highlights
Kaushik Patnaik is currently employed at Orbital Insight, Inc., where he continues to develop innovative solutions in the field of aerial imagery and machine learning. His work has the potential to revolutionize how aircraft are classified and monitored from above.
Collaborations
Kaushik collaborates with Shasvat Mukeshkumar Desai, contributing to the advancement of their projects and enhancing the capabilities of their technologies.
Conclusion
Kaushik Patnaik's contributions to aircraft classification through his innovative patent demonstrate his expertise and commitment to advancing technology in this field. His work at Orbital Insight, Inc. continues to pave the way for future developments in aerial imagery analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
